李小进

2006-9至2009-6, 华东师范大学, 微电子学与固体电子学, 博士, 导师: 赖宗声

2001-9至2004-6, 华东师范大学, 微电子学与固体电子学, 硕士, 导师: 赖宗声

1997-9至2001-6, 华东师范大学, 微电子学与固体电子学, 学士

2008年9-10月，中国台湾国立清华大学

2004-7至今, 华东师范大学, 助教，讲师，副教授，教授

聚焦国家重大战略需求领域中的VLSI核心技术，专注于集成电路设计及可靠性EDA技术研究。近年来一直与华大九天、华为i海思、上海集成电路研发中心(ICRD)、上海飞聚微电子等企业合作，开展产业技术进步急需的科学技术研究及国产芯片创新替代。设计流片芯片10余款，发表论文共80余篇,已授权发明专利36项。

上海市电子学会理事

华虹宏力、华力微电子企业国家级技术研发中心外聘专家

美国IRON CITY MICRO DISPLAY/日本IGNITE公司R&D技术顾问

中国研究生创“芯”大赛评委

集成电路设计

可靠性EDA技术

本科生：

 数字集成电路设计（上海市高校重点建设课程(优秀)）；数字集成电路综合设计实践。

 中国MOOC大学《数字集成电路设计》https://www.icourse163.org/course/ECNU-1206882801

研究生：

 VLSI设计与分析；混合信号集成电路设计

1.水平环栅场效应晶体管动态导热机制及电路电热可靠性协同设计，国家自然科学面上基金，主持

2.基于DTCO技术的车规级智能功率MOSFET全集成研究，上海市科委项目，主持

3.28纳米可靠性建模及EDA，企业合作项目，主持

4.MOSFET热效应表征仿真研究，企业合作项目，主持

5.UHF标签芯片设计开发，企业合作项目，主持

6.门电路复合应力模式下NBTI的退化机制及建模，61204038，国家青年自然科学基金，主持

7.40纳米GP工艺期间的可靠性模型研发，企业合作项目，主持

8.GFSK调制信号的MLSE同步与解调算法优化，企业合作项目，主持

9.NFC标签芯片技术开发合作，48302980，企业合作项目，主持

10.3D DLP Display研发设计，48400270，企业合作项目，主持

11.符合DVB-T/DTMB标准低功耗、低复杂度同步关键模块技术研究，07SA07，上海市科委

12.低功耗Viterbi译码器的FPGA设计，AM0508，上海市科委，主持

13.22nm FDSOI互连模型，2016ZX02301003，国家重大科技专项，主要研究人

14.深纳米三维FinFET结构栅围寄生电容模型及其波动性分布研究，61574056，国家自然科学基金，主要研究人

15.45nm成套产品工艺和IP-1，2009ZX02023-002-1，国家重大科技专项，主要研究人

项目经历：

fF级阵列小电容测试结构及电路设计

为国内头部EDA企业开发可靠性模型、建模流程及可靠性EDA工具接口（HRMI和OMI）

兼容DVB-T/DMBT关键模块(OFDM时频域估计与同步，FFT处理器)设计及FPGA验证

负责设计双层加密防伪RFID芯片设计

负责设计双接口NFC-Tag芯片，系统验证

负责40纳米NBTI退化效应监测电路设计及流片测试

负责AMD2B/AMD2B2，芯片调试（FIB，EMI），改版，流片测试

负责MEMS微镜显示驱动芯片(1920x1080)设计

CMOS器件可靠性NBTI理论发展，模型提取新方法，复合应力模式长时退化新模型

22纳米CMOS工艺后道互连线模型，提参及建模

1.     Zhangjun Shi, Xiaojin Li*, Yabin Sun, Bo Zhang, and Yanling Shi, Co-optimization between Static and Switching Characteristics of LDMOS with LDMOS with P-type Trapezoidal Gate Embedded in Drift Region,  IEEE Transactions on Electron Devices, vol. 69, no. 8, pp. 4102-4108, Aug. 2022 (通讯作者)

2.     Renhua Liu, Xiaojin Li*, Yabin Sun, and Yanling Shi, Thermal Coupling Among Channels and Its DC Modeling in Sub-7-nm Vertically Stacked Nanosheet Gate-All-Around Transistor,  IEEE Transactions on Electron Devices, vol. 68, no. 6, pp. 2249-2254, Dec. 2021 (通讯作者)

3.     Renhua Liu, Xiaojin Li*, Yabin Sun, and Yanling Shi, A Vertical Combo Spacer to Optimize Electrothermal Characteristics of 7-nm Nanosheet Gate-All-Around Transistor, in IEEE Transactions on Electron Devices, vol. 67, no. 6, pp. 2249-2254, June 2020 (通讯作者)

4.     Junya Sun, Xiaojin Li*, Yabin Sun*,and Yanling Shi, Impact of Geometry, Doping, Temperature, and Boundary Conductivity on Thermal Characteristics of 14-nm Bulk and SOI FinFETs, in IEEE Transactions on Device and Materials Reliability, vol. 20, no. 1, pp. 119-127, March 2020 (通讯作者)

5.     Xiaojin Li*, Jian Qing, Yabin Sun, Yan Zeng, and Yanling Shi, “Linear and Resolution Adjusted On-Chip Aging Detection of NBTI Degradation,” IEEE Transactions on Device & Material Reliability, vol. 18, No. 3 (2018). (第一作者)

6.     Xiaojin Li*, Jian Qing, Yabin Sun, and Yanling Shi, “Analytical Layout Dependent NBTI Degradation Modeling Based on Non-Uniformly Distributed Interface Traps,”IEEE Transactions on Device & Material Reliability, vol. 18, No. 3 (2018). (第一作者)

7.     Jian Qing, Yan Zeng, Xiaojin Li*, Yabin Sun, and Yanling Shi, “Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission,”Journal of Electronic Testing:Theory and Applications, vol.34, No. 5, (2018) (通讯作者)

8.     Yabin Sun, Ziyu Liu, Xiaojin Li* , Jiaqi Ren , Fanglin Zheng and Yanling Shi, “Analytical Gate Fringe Capacitance Model for Nanoscale MOSFET with Layout Dependent Effect and Process Variations,”Journal of Physics D: Applied Physics, 2018 (通讯作者)

9.     Yan Zeng, Xiaojin Li*, Yanling Wang, Yabin Sun, Yanling Shi, Ao Guo, et.al, Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered, Microelectronics Reliability · June 2017 (通讯作者)

10.     Yan Zeng, Xiaojin Li*, Yabin Sun*, Yanling Shi, Ao Guo, Shaojian Hu, Jian Qing, Detailed Study of NBTI Characterization in 40-nm CMOS Process Using Comprehensive Models, Chin. Phys. B. vol.26, No. 10 (2017) 108503 (通讯作者)

11.   Yabin Sun, Xiaojin Li^*, Jinzhong Zhang^* and Yanling Shi, Improved high-frequency equivalent circuit model based on distributed effects for SiGe HBTs with CBE layout, Chin. Phys. B Vol. 26, No. 9 (2017) 098502

12.     Chengsheng Liu, Fanglin Zheng, Yabin Sun*, Xiaojin Li* and Yanling Shi, Highly Flexible SRAM Cells Based on Novel Tri-Independent-Gate FinFET, Superlattices and Microstructures xxx (2017) 1-8  (通讯作者)

13.     Chengsheng Liu, Fanglin Zheng, Yabin Sun*, Xiaojin Li*, Yanling Shi, Novel tri-independent-gate FinFET for multi-current modes control, Superlattices and Microstructures Vol.109 (2017) 374-381  (通讯作者)

14.     Fanglin Zheng, Chengsheng Liu, Jiaqi Ren, Yanling Shi, Yabin Sun, Xiaojin Li*, Analytical capacitance model for 14 nm FinFET considering dual-k spacer, Chin. Phys. B Vol. 26, No. 7 (2017) 077303 (通讯作者)

15.     Xiaojin Li*, Jian Qing, Yanling Wang, and Yanling Shi, Prediction of NBTI degradation in dynamic voltage frequency scaling operations, IEEE Transactions on Device & Material Reliability, 2016.01.01, vol. 16, No. 1 9-19. (第一作者)

16.     Yanling Wang, Xiaojin Li*, Jian Qing, and Yanling Shi, Analytical parameter extraction for NBTI reaction diffusion and trapping/detrapping models, Microelectronics Reliability · June 2016, 66, 10-15. (通讯作者)

17.     Xiaojin Li*, Linhui Lai, Ao Lei, Zongsheng Lai, A direct digital frequency synthesizer based on two segment forth-order parabolic approximation, IEEE Transaction on Consumer Electronics, vol.55, No. 2, pp.322-326, May 2009 (第一作者)

18.     Xiaojin Li*, Linhui Lai, Ao Lei, Zongsheng Lai, A Memory-Reduced direct digital frequency synthesizer for OFDM receiver systems, IEEE Transaction on Consumer Electronics, vol.54, No. 4, pp.1564-1568, Nov. 2008 (第一作者)

19.     Xiaojin Li*, Zongsheng Lai, Jianmin Cui, A low power and small area FFT processor for OFDM demodulator, IEEE Transaction on Consumer Electronics, vol.53, No. 2, pp.322-326, May 2007 (第一作者)

20.     Xiaojin Li*, Zongsheng Lai, A low complexity sign ML detector for symbol and frequency synchronization of OFDM systems, IEEE Transaction on Consumer Electronics, vol.52, No. 2, pp.317-320, May 2006 (第一作者)

指导学生获奖（近年）

2019年，第二届华为杯中国研究生创“芯”大赛全国一等奖（优秀指导教师）、全国二等奖

2019年，第三届全国大学生集成电路创新创业大赛华东赛区二等奖

2018年，首届华为杯中国研究生创“芯”大赛全国二等奖

2017年，第十二届华为杯中国研究生电子设计大赛集成电路专业赛全国一等奖